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Nikon 200mm Wafer Indexer Lift Assembly OPTISTATION 3 Inspection System Used B This Varian Semiconductor Equipment

SKU: 65499769739

4.4
USD181.09 USD212.09

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Description

B This Varian Semiconductor Equipment VSEA 16731 XPC PCB Card is used working surplus

Inventory # A-18073

TRAP JAR COT-1 This TEL Tokyo Electron 2924-000114-11 Trap Jar COT-1 Coat Process Assembly is used working surplus

Part No: USSDKL63-188B

Nikon 200mm Wafer Indexer Lift Assembly OPTISTATION 3 Inspection System Used B This Varian Semiconductor EquipmentNikon 200mm Wafer Indexer Lift Assembly OPTISTATION 3 Inspection System Used Inventory # 18005 This Nikon 200mm Wafer Indexer Lift Assembly OPTISTATION 3 Inspection System is used working surplus. The physical condition is good, but there are signs of previous use and handling. Specifications Part No: 200mm Wafer Indexer Lift Removed from a Nikon OPTISTATION 3 200mm Automatic Wafer Inspection System Installed Component Minebea Part No: 23LM C004,

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